Scanning electron microscopes
Esquema
Jerarquía
Furnishings and Equipment (Hierarchy Name) > Tools and Equipment > equipment > <equipment by profession or discipline> > <equipment for science and technology> > optical instruments > microscopes > electron microscopes
Descripción
Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam.
URI original del concepto
Otros términos
- scanning electron microscope [en]
- microscope, scanning electron [en]