Particle-induced x-ray emission

Esquema

Getty AAT: Processes and techniques by specific type

Jerarquía

analysis and testing techniques > spectroscopy

Descripción

A technique of elemental analysis in which a small area on a surface is bombarded with charged particles (non-electrons, usually protons) to produce fluorescent X-rays specific to an element. The method is used in conservation science, archaeology, and geology to obtain an elemental map which may guide research regarding dating, provenance and authenticity.

URI original del concepto

http://vocab.getty.edu/aat/300379539

Otros términos

  • PIXE (particle-induced x-ray emission) [en]
  • particle-induced x-ray emission analysis [en]
  • proton-induced x-ray emission [en]
  • x-ray emission, particle-induced [en]