Scanning electron microscopes

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    1. <skos:Concept rdf:about="http://vocab.getty.edu/aat/300343819">

      1. <skos:prefLabel xml:lang="en">scanning electron microscopes</skos:prefLabel>

      2. <skos:altLabel xml:lang="en">scanning electron microscope</skos:altLabel>

      3. <skos:altLabel xml:lang="en">microscope, scanning electron</skos:altLabel>

      4. <skos:broader rdf:resource="http://museovirtualfelixcanada.digibis.com//concepts/58656" />

      5. <skos:note xml:lang="en">Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam.</skos:note>

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