Particle-induced x-ray emission

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    1. <skos:Concept rdf:about="http://vocab.getty.edu/aat/300379539">

      1. <skos:prefLabel xml:lang="en">particle-induced x-ray emission</skos:prefLabel>

      2. <skos:altLabel xml:lang="en">PIXE (particle-induced x-ray emission)</skos:altLabel>

      3. <skos:altLabel xml:lang="en">particle-induced x-ray emission analysis</skos:altLabel>

      4. <skos:altLabel xml:lang="en">proton-induced x-ray emission</skos:altLabel>

      5. <skos:altLabel xml:lang="en">x-ray emission, particle-induced</skos:altLabel>

      6. <skos:broader rdf:resource="http://museovirtualfelixcanada.digibis.com//concepts/85235" />

      7. <skos:note xml:lang="en">A technique of elemental analysis in which a small area on a surface is bombarded with charged particles (non-electrons, usually protons) to produce fluorescent X-rays specific to an element. The method is used in conservation science, archaeology, and geology to obtain an elemental map which may guide research regarding dating, provenance and authenticity.</skos:note>

      8. <skos:notation>300379539</skos:notation>

      9. <skos:inScheme rdf:resource="http://museovirtualfelixcanada.digibis.com//schemas/28" />

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