Particle-induced x-ray emission
Esquema
Jerarquía
Descripción
A technique of elemental analysis in which a small area on a surface is bombarded with charged particles (non-electrons, usually protons) to produce fluorescent X-rays specific to an element. The method is used in conservation science, archaeology, and geology to obtain an elemental map which may guide research regarding dating, provenance and authenticity.
URI original del concepto
Otros términos
- PIXE (particle-induced x-ray emission) [en]
- particle-induced x-ray emission analysis [en]
- proton-induced x-ray emission [en]
- x-ray emission, particle-induced [en]